Instrumentation for Accelerator-based Techniques for Analysis:
Doug Jeffers |
Professor Ivan Petrov- Director |
Professor Robert Averback |
Location
B70 Materials Research Laboratory
General
The Van de Graaff operates at energies up to 2.3 MeV for H, He, Ar, Kr , Xe and Ne with 1-2-3 mm beam-size apertures.
There is a beam line for Rutherford backscattering spectroscopy (RBS), elastic recoil detection. Nondestructive
depth profiles of thin films can be obtained as deeply as several microns into the sample. Available source gases
include H, He, Ne, Ar, and Kr. The sample goniometer can be set to allow or prevent channeling.