MRL

Materials Research Laboratory

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CMM- Atomic Force Microscopy (AFM)

Staff Contact:

Scott MacLaren
(217) 244-2469 (office)
maclaren@illinois.edu

RHK Ultrahigh Vacuum AFM

We have a UHV-AFM/STM from RHK Technology. This system operates in ultrahigh vacuum, allowing the study of surfaces that have not been exposed to air. A portable vacuum system allows samples to be transferred from remote growth chambers to the AFM under vacuum. The AFM operates in contact or noncontact AFM modes as well as STM. A heating element allows sample cleaning and annealing. Scanning is only done at room temperature for now, but the system is upgradeable to variable temperature. UHV noncontact AFM is capable of true atomic resolution.