CMM- Transmission and Scanning Transmission Electron Microscopy (TEM and STEM)
Instrumentation for Transmission and Scanning Transmission Electron Microscopy:
TEM Instruments
Staff Contact:
Changhui Lei |
Mike Marshall |
Vacuum Generators HB501 STEM
General:
The HB501 is a dedicated analytic STEM. It is capable of forming a 0.3nm probe operating at 100kV, but is more typically used
with a 1.0nm probe with over 1.0nA beam current. It can also be operated at much higher beam currents but with a loss of resolution.
A double tilt holder is available with +-15 degrees of tilt. The system is fitted with digital scan control, light element EDS and
parallel EELS. The cold field emitter has a very low intrinsic energy width (~0.35eV). EDS mapping and line scanning is available
Location
B58 Materials Research Laboratory
Specifications:
- Energy 100kV
- Tilt 15 degrees on two axes
- Ultimate probe size 0.3nm (Typical: 0.6nm - 1.0nm - 1.5nm)
- Simultaneous BF and ADF
- Lens Type-Top entry
Attachments:
- EDS - Oxford ISIS 30mm ATW detector
- EELS - Gatan DigiPEELS
- Digital Scan - Gatan Digiscan
- Microdiffraction - Intensified TV lens coupled to phosphor screen
- HAADF Mask