Materials Research Laboratory

JEOL 2200FS (S)TEM

Usage Rules
Links

General:
The aberration-corrected JEM-2200FS, a state-of-the-art analytical electron microscope, is equipped with a 200kV field emission gun (FEG), a CEOS probe Cs-corrector, and an in-column energy filter (Omega Filter) that allows elemental analysis and chemical analysis of specimens. It is also equipped with an Energy Dispersive X-ray Spectrometer (EDS) and a CCD-camera. With an available small probe size of ~0.1 nm atomic level high-resolution high-angle annular dark-field (Z-contrast) images, and high resolution EELS spectrum imaging can be obtained. With the low background Be specimen holder, large (50 mm2) detector area, and the hard X-ray aperture, high-quality EDS analysis and mapping is available.

Location
B70C Materials Research Laboratory

Specifications:

• Cs = 0.5mm Cc = 1.1mm
• Energy 200kV
• Tilt 25 degrees on both axes
• HAADF Resolution = 0.1nm
• HREM Point resolution = 0.19nm
• Information Limit better than 0.1nm
• Sample loading-Side entry
• Energy Spread better than 0.8eV

Attachments:

• Corrector - CEOS Cs-corrector system
• Image Filter – In-column Omega Filter
• EDS - Oxford INCA 50mm2 detector
• Digital Imaging - 2k Gatan CCD
• Digital Scan - Gatan Digiscan
• Video - Hamamatsu cameras
• HAADF Detector
• BF Detector
• Low-background double tilt holder

Links

• CMM-Library (UIUC only)
• TEM Instructions
• Software Instructions
• JEOL Web Site