CMM- Staff
Wacek Swiech
Center for Microanalysis of Materials
Frederick Seitz Materials Research Laboratory
104 S. Goodwin Avenue
Urbana, IL 61801 USA
(217) 244-9532
wswiech@illinois.edu
Techniques
Low Energy Electron Microscopy (LEEM)
Transmission Electron Microscopy (TEM)
Scanning Electron Microscopy (SEM)
Auger Electron Spectroscopy (AES)