CMM Invited Lecture Series

This talk will cover electrical measurement techniques that are employed in Atomic Force Microscopy. Techniques will include methods to determine conductive versus insulating regions of a sample, work function and potential difference between the tip and the sample, conductivity or spreading resistance of samples, potential variances on the surfaces on liquids, piezo force microscopy, and a new technique that employs a network analyzer to look at the electrical properties of a material.

Examples will be given of each.