Center for Microanalysis of Materials - Frederick Seitz Materials Research Laboratory - University of Illinois

3rd Advanced Materials Characterization Workshop 2009

Date: June 3 and 4, 2009
Venue: Engineering Sciences Building, Room 190
1101 West Springfield Avenue, Urbana, IL 61801

This workshop will provide a condensed overview of the most important analytical techniques with strong focus in practical applications and problem solving strategies. The lectures will cover mainstream techniques such as:

  • atomic force microscopy (AFM)
  • x-ray diffraction, reflectivity and fluorescence (XRD, XRR and XRF)
  • scanning electron microscopy (SEM)
  • focused ion beam (FIB)
  • Auger electron spectroscopy (AES)
  • x-ray photoelectron spectroscopy (XPS)
  • transmission and scanning transmission electron microscopy (TEM, STEM)
  • secondary ion mass spectrometry (SIMS)
  • Rutherford backscattering (RBS)
  • optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry), etc.

The lectures will be given by FS-MRL facility scientists with 10+ years of hands-on experience in each particular technique. The workshop will cover:

  • The fundamentals of each analytical technique.
  • Comparative review of the instrumentation options with emphasis on differences in resolution, sensitivity, sample requirements.
  • Data acquisition strategies and data interpretation methods.
  • Expert tips on how to avoid measurement artifacts.
  • Critical review of strengths and weaknesses of each technique: how to combine techniques to extract the best possible complementary information.
  • Detailed discussion of practical examples including industrial applications in nanotechnology, microelectronics, thin films, coatings, bioengineering, mineralogy, medical and pharmaceutical research.

Instrument vendors and industrial scientists will be present during the workshop to discuss new instrumentation, applications and technology. Laboratory tours and demonstration of the main instruments available at the CMM will be given during the workshop.

Registration is required.
Registration is now closed - Workshop is sold out.