Advanced Materials Characterization Workshop 2009

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Workshop lectures and application highlights:

• Materials Characterization: The Need for Complementary Techniques, Prof. Ivan Petrov.
• X-ray diffraction, reflectometry and fluorescence, Dr. Mauro Sardela.
• Optical characterization of materials, Dr. Julio Soares - 2009 lecture coming soon. 2008 lecture available.
• Auger electron spectroscopy and X-ray photoelectron spectroscopy, Dr. Richard Haasch.
• Rutherford backscattering and secondary ion mass spectrometry, Dr. Timothy Spila.
• Scanning Electron Microscopy and Focused Ion Beams in Materials Research, Dr. Wacek Swiech.
• Transmission electron microscopy, Dr. Jianguo Wen.


• Thin film characterization with spectroscopic ellipsometry by Dr. Andrea Fuchser, J.A.Woollam Inc.
• Organic Thin Film Analysis by Dr. K Bombem, PHI.
• Measuring Thin Film Composition and Thickness Using SEM-EDS by Dr. N. Rowland, Oxford Instr.
• High resolution X-ray tomography in the SEM by Dr. Paul Mainwaring, Gatan.
• X-ray Pair Distribution Function by Dr. Milen Gateshki, PANalytical.

Vendor brochures:

• Cypher AFM, by Asylum Research.
• 2009 edition catalog, by Chemplex.
• 2009 product overview, by Oerlikon Leybold Vacuum.
• Application note: Nanoparticle sizing solution, by PANalytical.
• Application note: Semiconductor analysis, by PANalytical.
• Application note: Solar cells, by PANalytical.