University of Illinois at Urbana-Champaign

Center for Microanalysis of Materials

About Us

CMM provides researchers with an open access for self-use to a comprehensive array of modern nanostructural and nanochemical analysis techniques including electron microscopy, scanning probe microscopy, surface microanalysis, x-ray scattering, and ion-beam spectroscopies; these instruments are maintained, operated and developed by professional scientists who teach instrument use and assist in interpretation of results.
Learn More